Join us as we delve into the simulation of the dark count rate (DCR) in silicon SPADs using Ansys Lumerical CHARGE. Participants will learn about the workflow for simulating the electric field and thermal generation rates, followed by calculating the avalanche triggering probability and DCR.
TIME:
August 22, 2024
Session 1: 9:00 am EDT
Session 2: 2:00 pm EDT
Venue:
Virtual
SESSION 1: 9:00 AM EDT
SESSION 2: 2:00 PM EDT
Single-photon avalanche Detectors (SPADs) are highly sensitive devices used for detecting single photons, but they can also generate avalanches in dark conditions due to the thermal generation of electron-hole pairs.
This webinar will explore the dark count rate (DCR) simulation in Silicon SPADs using Ansys Lumerical CHARGE. Participants will learn about the workflow for simulating the electric field and thermal generation rates, then calculate the avalanche triggering probability and DCR. We will also present benchmarked simulation results against a proprietary Si SPAD device. This session is designed for users with Ansys Lumerical version 2023 R2.1 or later.
Optical Engineer, Photonics Engineer, Engineering Management
Khashayar Ghaffari, Senior Application Engineer
