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How NXP Semiconductors Utilizes Model-Based FuSa Analysis for Automotive SoCs

Learn how model-based safety analysis is utilized at NXP Semiconductors to develop safety-critical automotive SoCs. You'll also learn specific safety analysis techniques used for SoC FuSa analysis and verification techniques.

Venue:
Virtual

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Overview

The semiconductor and automotive industry advancements facilitate a disruptive transformation towards connected, electrified, and autonomous Vehicles. Modern vehicles are built with advanced multi-processor System-on-Chips (SoCs), enabling safety-critical applications like ADAS, vehicle safety systems, and sensor fusion and processing. These safety critical systems enforce stringent functional safety requirements on the SoCs to ensure overall vehicle system safety. 

What you will learn

  • How model-based safety analysis is utilized at NXP Semiconductors to develop safety-critical automotive SoCs
  • Specific safety analysis techniques used for SoC FuSa analysis, such as fault tree analysis, dependent failure analysis, and FMEDA
  • Verification techniques such as fault injection simulation and its integration with safety analysis in a model-based environment

Who should attend

Functional safety engineers and analysts, verification engineers, and ADAS engineers

Speaker

Gulroz Singh, Sr. SoC Functional Safety Architect at NXP Semiconductors