Integrated Statistical and Convolution analysis
ANSYS DesignerSI offers several types of statistical and convolution analysis types that can rapidly and easily provide channel metrics such as BER, eye patterns etc.
VerifEye is a methodology for eye analysis of serial links using statistical methods that maintains accuracy while offering major reductions in run time compared to conventional transient methods. This statistical analysis tool represents the most practical means to test for the low bit-error rates needed by today's multi-Gb/s channel designers.
QuickEye is a fast convolution analysis that simulates millions of user-defined bits in a matter of seconds using linear superposition. Using the peak distortion analysis option QuickEye automatically determines the worst-case bit pattern for the design engineer by identifying the channel-specific bit pattern that causes maximum channel degradation.
IBIS-AMI is a fast analysis similar to the QuickEye or VerifEye analysis that allows you to incorporate channel equalization along with compiled vendor libraries. As with VerifEye and QuickEye, IBIS-AMI (advanced model interconnect) simulations include transmit jitter, receiver jitter and DCD. IBIS-AMI analysis supports GPU to speed the analysis.